A System for Measuring the Complex Susceptibility of Small Samples at High Temperatures

COMPLEX DIELECTRIC CONSTANT MEASUREMENT APPARATUS

----       measures both the real (ε') and the absorptive part (ε") of the
            relative complex dielectric constant, ε = ε' - jε" using cavity
            perturbation technique
----       at a few selected frequencies between 400 MHz and 3000 MHz
----       at sequentially selected temperatures in range 25°C to 1450°C
----       over a user-specified rate and temperature range
----       in a selected cover gas atmosphere – vacuum to 6 atm absolute

Schematic diagram of the TM_ono cavity system (in cross-section) showing the linear actuator with the high purity amorphous silica sample holder and a sample located on axis in the centre of the cavity.

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